Produkte
Product
Near Field
Images
;){kind=small}
;){kind=small}
;){kind=small}
;){kind=small}
;){kind=small}
;){kind=small}
The goal of using H 1, H 2, H 3 Field Source Sets is to locate the weak spots with small, local field sources and pinpoint them in the component and layout area.
The probes enable both pulse field coupling into device housings (based on EN 61000-4-4) and weak spot localization on PCB´s.
The E/B field sources are design for connection to customary burst generators.
Features:
The probes enable both pulse field coupling into device housings (based on EN 61000-4-4) and weak spot localization on PCB´s.
The E/B field sources are design for connection to customary burst generators.
Features:
- The noise immunity imperfections detected at standard tests may be exactly located and eliminated;
- Generation of pulsating electrical and magnetic fields;
- Application for modules, components, conductors and Ics;
- Suited for the connection to a burst generator according to EN 61000-4-4;
- Convenient handling by pencil shape, light plug-type cable with snap-action coupling.
Unterstützung
Für allgemeine Anfrage oder technische Unterstützung, bitte kontaktieren Sie uns unter:
Hauptstelle
|
|
Wenn Sie nicht bereits registriert sind, klicken Sie hier um die Einrichtung eines Anmeldekonto.
Passwort vergessen?
News
Kontakt
Information
E-mail:sales@afj-emv.com
